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Volumn 13, Issue 5, 2010, Pages

Low specific on-resistance AlGaN/AlN/GaN high electron mobility transistors on high resistivity silicon substrate

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/ALN/GAN; BREAKDOWN VOLTAGE; DRAIN RESISTANCES; EXTRINSIC TRANSCONDUCTANCE; FIGURE OF MERIT; GATE DRAIN; HIGH RESISTIVITY; HIGH-RESISTIVITY SILICON SUBSTRATE; OHMIC RECESS; PARASITIC RESISTANCES; SOURCE RESISTANCE; SPECIFIC-ON-RESISTANCE; TI/AL/NI/AU;

EID: 77949675940     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3339068     Document Type: Article
Times cited : (19)

References (19)
  • 8
    • 0000620946 scopus 로고    scopus 로고
    • Effect of polarization fields on transport properties in AlGaN/GaN heterostructures
    • DOI 10.1063/1.1339858
    • L. Hsu and W. Walukiewicz, J. Appl. Phys. 0021-8979, 89, 1783 (2001). 10.1063/1.1339858 (Pubitemid 33630003)
    • (2001) Journal of Applied Physics , vol.89 , Issue.3 , pp. 1783-1789
    • Hsu, L.1    Walukiewicz, W.2
  • 9
    • 36048949306 scopus 로고    scopus 로고
    • Ohmic contacts to n+ -GaN capped AlGaNAlNGaN high electron mobility transistors
    • DOI 10.1063/1.2754371
    • L. Wang, F. M. Mohammed, B. Ofuonye, and I. Adesida, Appl. Phys. Lett. 0003-6951, 91, 012113 (2007). 10.1063/1.2754371 (Pubitemid 350092099)
    • (2007) Applied Physics Letters , vol.91 , Issue.1 , pp. 012113
    • Wang, L.1    Mohammed, F.M.2    Ofuonye, B.3    Adesida, I.4
  • 14
    • 33847032591 scopus 로고    scopus 로고
    • Temperature dependent microwave performance of AlGaN/GaN high-electron-mobility transistors on high-resistivity silicon substrate
    • DOI 10.1016/j.tsf.2006.07.168, PII S0040609006009710, The Third International Conference on Materials for Advanced Technologies (ICMAT 2005) Symposium J - III- V Semiconductors for Microelectronic and Optoelectronic Applications ICMAT 2005
    • S. Arulkumaran, Z. H. Liu, G. I. Ng, W. C. Cheong, R. Zeng, J. Bu, H. Wang, K. Radhakrishnan, and C. L. Tan, Thin Solid Films 0040-6090, 515, 4517 (2007). 10.1016/j.tsf.2006.07.168 (Pubitemid 46274861)
    • (2007) Thin Solid Films , vol.515 , Issue.10 , pp. 4517-4521
    • Arulkumaran, S.1    Liu, Z.H.2    Ng, G.I.3    Cheong, W.C.4    Zeng, R.5    Bu, J.6    Wang, H.7    Radhakrishnan, K.8    Tan, C.L.9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.