The influence of crystallization route on the Ce-doped Bi2Ti2O7 thin film by metal organic decomposition

Journal of Alloys and Compounds

Volumn 494, Issue 1-2, 2010, Pages 285-288

  Wang, J C ^a   Yang, C H ^a   Hu, G D ^a   Wu, W B ^a   Cheng, L ^a   Chen, X M ^a  

^a UNIVERSITY OF JINAN   (China)

Author keywords

Crystallization route; Dielectric property; Thin films

Indexed keywords

CAPACITANCE-VOLTAGE HYSTERESIS; CONVENTIONAL ANNEALING; DISSIPATION FACTORS; ELECTRICAL PROPERTY; INSULATING PROPERTIES; METAL ORGANIC DECOMPOSITION; METALORGANIC DECOMPOSITION METHOD; OXIDE THICKNESS; P-TYPE SI; PYROCHLORES; RELATIVE DIELECTRIC CONSTANT;

AMORPHOUS FILMS; ANNEALING; CERIUM COMPOUNDS; CRYSTALLIZATION; DECOMPOSITION; DIELECTRIC PROPERTIES; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; HYSTERESIS; HYSTERESIS LOOPS; OCEAN CURRENTS; ORGANOMETALLICS; THIN FILMS;

CERIUM;

EID: 77649189205     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.01.010     Document Type: Article

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