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Volumn 88, Issue 1, 2004, Pages 67-70

Samarium-doped Bi4Ti3O12 thin films grown on SiO2/p-Si(1 1 1) by spin coating metalorganic solution decomposition method

Author keywords

Crystal structure; Ferroelectric materials; Thin films

Indexed keywords

BISMUTH COMPOUNDS; COMPOSITION EFFECTS; CRYSTAL STRUCTURE; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; HYSTERESIS; PERMITTIVITY; SAMARIUM; SILICA; SILICON; SPIN COATING; X RAY DIFFRACTION ANALYSIS;

EID: 4644328085     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2004.06.017     Document Type: Article
Times cited : (5)

References (15)
  • 9
    • 4644265389 scopus 로고    scopus 로고
    • Joint Committee on Power Diffraction Standards (JCPDS) file. No. 35-795
    • Joint Committee on Power Diffraction Standards (JCPDS) file. No. 35-795.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.