Electrical and optical properties of Bi2Ti2O 7 thin films prepared by metalorganic decomposition method

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1214-1216

  Hou, Yun ^a   Lin, Tie ^a   Huang, Zhiming ^a   Wang, Genshui ^a   Hu, Zhigao ^a   Chu, Junhao ^a   Xu, Xiaohong ^b   Wang, Min ^b  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b SHANDONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH NITRATE; EXTINCTION COEFFICIENT; LEAKAGE CURRENT DENSITY; OPTICAL CONSTANTS;

BISMUTH COMPOUNDS; ELECTRIC PROPERTIES; ELLIPSOMETRY; INSULATING MATERIALS; LEAKAGE CURRENTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOS CAPACITORS; OPTICAL PROPERTIES; REFRACTIVE INDEX; TITANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 4444340869     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1777823     Document Type: Article

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