Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy

Corrosion Science

Volumn 52, Issue 4, 2010, Pages 1305-1316

  Keil, P ^a   Frahm, R ^b   Lutzenkirchen Hecht D ^b  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

A. Copper; A. Sputtered films; B. AFS (EXAFS XANES); C. Atmospheric corrosion; C. Oxidation; C. Passive films

Indexed keywords

C. ATMOSPHERIC CORROSION; C. OXIDATION; EXAFS; PASSIVE FILMS; SPUTTERED FILMS; XANES;

ATMOSPHERIC CORROSION; COPPER; GAS ABSORPTION; NEUTRON REFLECTION; OXIDATION; OXIDE FILMS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 77249152613     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2009.12.012     Document Type: Article

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