SCOPUS 정보 검색 플랫폼

Volumn 77, Issue 1, 2004, Pages 27-35

On the surface analysis of copper oxides: The difficulty in detecting Cu3O2

(10) Mencer, D E a Hossain, M A b Schennach, R b Grady, T c McWhinney, H c Gomes, J A G b Kesmez, M b Parga, J R d Barr, T L e Cocke, D L b

a WILKES UNIVERSITY (United States)

b LAMAR UNIVERSITY (United States)

c PRAIRIE VIEW A AND M UNIVERSITY (United States)

d INSTITUTO TECNOLÓGICO DE SALTILLO (Mexico)

e University of Wisconsin Milwaukee (United States)

Author keywords

Copper; Cu3O2 oxidation; Sputter reduction; XPS

Indexed keywords

DEFECTS; DEMODULATION; OXIDATION; SPUTTER DEPOSITION; SURFACE TREATMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEFECT STRUCTURE; SPUTTER REDUCTION; SURFACE ANALYSIS; VERTICAL OXIDE LAYER;

COPPER OXIDES;

EID: 9644275439 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2004.07.068 Document Type: Article

Times cited : (21)

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