Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness

Journal of Synchrotron Radiation

Volumn 16, Issue 4, 2009, Pages 443-454

  Keil, P ^a   Lutzenkirchen Hecht D ^b  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

Copper; DWBA; EXAFS; Grazing incidence; Oxidation; Reflection mode; Surface roughness; Thin films; XANES

Indexed keywords

DWBA; EXAFS; GRAZING INCIDENCE; REFLECTION MODE; XANES;

APPROXIMATION THEORY; BORN APPROXIMATION; COPPER; ELECTROMAGNETIC WAVE ABSORPTION; METAL ANALYSIS; NEON; OXIDATION; SURFACE PROPERTIES; SURFACE ROUGHNESS; THIN FILMS; X RAY ANALYSIS;

REFLECTION;

EID: 67651172897     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509015684     Document Type: Article

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