Grazing incidence XAFS under non-specular conditions

Physica B: Condensed Matter

Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 1-5

  Keil, Patrick ^a   Lützenkirchen Hecht, Dirk ^a   Frahm, Ronald ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

Atomic short range order; Copper; Diffuse scattering; EXAFS; X ray reflectivity; X ray scattering

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; DIFFUSION; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; OXIDATION; SENSITIVITY ANALYSIS; SPUTTER DEPOSITION; X RAY SCATTERING;

ATOMIC SHORT-RANGE ORDER; DIFFUSE SCATTERING; EXTENDED X-RAY ABSORPTION FINE STRUCTURE TECHNIQUE (EXAFS); X-RAY REFLECTIVITY;

THIN FILMS;

EID: 13444292328     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.11.007     Document Type: Conference Paper

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