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Volumn 92, Issue 1, 2008, Pages

Charge transport mechanisms in microcrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ALLOYS; CONDUCTION BANDS; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; MICROCRYSTALLINE SILICON; MICROSTRUCTURE; MORPHOLOGY; TRANSISTORS;

EID: 38049094921     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828991     Document Type: Article
Times cited : (23)

References (13)
  • 2
    • 0001367748 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.21.2180.
    • P. Sheng, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.21.2180 21, 2180 (1980).
    • (1980) Phys. Rev. B , vol.21 , pp. 2180
    • Sheng, P.1
  • 4
    • 0033300111 scopus 로고    scopus 로고
    • Amorphous and Heterogeneous Silicon Thin Films: Fundamentals to Devices-1999, Materials Research Society Symposia Proceedings Vol. (Materials Research Society, San Francisco),.
    • J. Kočka, A. Fejfar, V. Vorliček, H. Stuchlí ková, and J. Stuchlík, Amorphous and Heterogeneous Silicon Thin Films: Fundamentals to Devices-1999, Materials Research Society Symposia Proceedings Vol. 557 (Materials Research Society, San Francisco, 1999), p. 483.
    • (1999) , vol.557 , pp. 483
    • Kočka, J.1    Fejfar, A.2    Vorliček, V.3    Stuchlíková, H.4    Stuchlík, J.5
  • 7
    • 42149153057 scopus 로고    scopus 로고
    • in Thin Film Solar Cells, edited by J. Poortmans and V. I. Arkhipov (Wiley, New York),.
    • E. Vallat-Sauvain, A. Shah, and J. Bailat, in Thin Film Solar Cells, edited by, J. Poortmans, and, V. I. Arkhipov, (Wiley, New York, 2006), p. 133.
    • (2006) , pp. 133
    • Vallat-Sauvain, E.1    Shah, A.2    Bailat, J.3
  • 9
    • 24444441237 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.37.302.
    • D. J. Frank and C. J. Lobb, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.37.302 37, 302 (1988).
    • (1988) Phys. Rev. B , vol.37 , pp. 302
    • Frank, D.J.1    Lobb, C.J.2
  • 12
    • 38049028786 scopus 로고    scopus 로고
    • Film thicknesses of Ref. samples are based on private communication.
    • Film thicknesses of Ref. samples are based on private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.