Characterization of mixed phase silicon by Raman spectroscopy

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1209-1212

  Ledinsky M ^a   Fekete, L ^a   Stuchlik J ^a   Mates, T ^a   Fejfar, A ^a   Kocka J ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Atomic force and scanning tunneling microscopy; Raman scattering; Silicon

Indexed keywords

ABSORPTION; AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; PHONONS;

AMORPHOUS MATRIX; ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY; INTEGRAL INTENSITIES; RAMAN CRYSTALLINITIES;

SILICON;

EID: 33744546221     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.10.072     Document Type: Article

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