Evaluation of a simple correction for the hydrocarbon contamination layer in quantitative surface analysis by XPS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 148, Issue 1, 2005, Pages 21-28

  Smith, Graham C ^a  

^a SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

Author keywords

Hydrocarbon; Mean error; XPS

Indexed keywords

ALGORITHMS; CRYSTALLIZATION; HYDRATION; HYDROCARBONS; KINETIC ENERGY; MONOLAYERS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

HYDROCARBON CONTAMINATION; MEAN ERROR; RELATIVE ERRORS; RELATIVE SENSITIVE FACTORS (RSF);

CONTAMINATION;

EID: 18444412603     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.02.004     Document Type: Article

References (25)

1. M. Ebel, M. Schmidt, H. Ebel, and J. Vogel J. Electron Spectrosc. Relat. Phenom. 34 1984 313
2. B.C. Brizzolara, and R.A. Beard J. Vac. Sci. Technol. A14 1996 89
3. R.A. Brizzolara, and B.C. Beard Surf. Interface Anal. 27 1999 716
4. L. Griffiths, and L. Bradley Appl. Spectrosc. 49 1992 1426
5. M. Burrell, and N. Armstrong Appl. Surf. Sci. 17 1983 53
6. A. Zagorenko, P. Beccat, Y. Huiban, and J. Lynch Surf. Interface Anal. 23 1995 180
7. S. Tougaard, and C. Jansson Surf. Interface Anal. 20 1993 1013
8. S. Evans Surf. Interface Anal. 25 1997 924
9. G. Vereeke, and P.G. Rouxhet Surf. Interface Anal. 27 1999 761
10. P.C. Zalm Surf. Interface Anal. 26 1998 352
11. J.E. Castle, and M.A. Baker J. Electron Spectrosc. Relat. Phenom. 105 1999 245
12. M.P. Seah second ed. D. Briggs M.P. Seah Auger and X-ray Photoelectron Spectroscopy vol. 1 1990 Wiley Chichester pp. 201-256, (Chapter 5)
13. S. Tanuma, C.J. Powell, and D.R. Penn Surf. Interface Anal. 21 1993 165
14. M.P. Seah, and S.J. Spencer J. Vac. Sci. Technol. A 21 2003 345
15. S. Tanuma, C.J. Powell, and D.R. Penn Surf. Interface Anal. 17 1991 927
16. M.P. Seah, and W.A. Dench Surf. Interface Anal. 1 1979 2
17. P.J. Cumpson, and M.P. Seah Surf. Interface Anal. 25 1997 430
18. Agar Scientific Ltd., 66a Cambridge Road, Stanstead, Essex, UK.
19. R.F. Reilman, A. Msezane, and S.T. Manson J. Electron Spectrosc. Relat. Phenom. 8 1976 389
20. A. Jablonski Surf. Interface Anal. 14 1989 659
21. M.P. Seah J. Electron Spectrosc. Relat. Phenom. 71 1995 191
22. D.A. Shirley Phys. Rev. B5 1972 4709
23. J.H. Scofield J. Electron Spectrosc. Relat. Phenom. 8 1976 129
24. P.J. Cumpson, private communication, 1997.
25. D.R. Baer, D.J. Gaspar, M.H. Engelhard, and A.S. Lea D. Briggs J.T. Grant Surface Analysis by Auger and X-ray Photoelectron Spectroscopy 2003 IM Publications Ltd. Chichester, West Sussex, UK pp. 211-233, (Chapter 9)