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Volumn 78, Issue 1, 2006, Pages 141-148

Metal nanoparticle deposition for TOF-SIMS signal enhancement of polymers

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-MASS FRAGMENT IONS; TIME-OF-FLIGHT;

EID: 30144439759     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0513921     Document Type: Article
Times cited : (43)

References (40)
  • 14
    • 30044452766 scopus 로고    scopus 로고
    • Photographic materials
    • Vickerman, J. C., Briggs, D., Eds.; Surface Spectra Limited; IM Publications: Manchester, U.K.
    • Verlinden, G.; Gijbels, R.; Geuens, I. Photographic Materials. In ToF-SIMS: Surface Analysis by Mass Spectrometry, Vickerman, J. C., Briggs, D., Eds.; Surface Spectra Limited; IM Publications: Manchester, U.K., 2001; pp 727-752.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 727-752
    • Verlinden, G.1    Gijbels, R.2    Geuens, I.3
  • 27
    • 0010625898 scopus 로고    scopus 로고
    • Optimisation Methods: Cationisation
    • Vickerman, J. C., Briggs, D., Eds.; IM Publications and Surface Spectra: Charlton, Chichester, West Sussex
    • Hagenoff, B. Optimisation Methods: Cationisation. In ToF-SIMS: Surface Analysis by Mass Spectrometry, 1 ed.; Vickerman, J. C., Briggs, D., Eds.; IM Publications and Surface Spectra: Charlton, Chichester, West Sussex, 2001; pp 285-308.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry, 1 Ed. , pp. 285-308
    • Hagenoff, B.1
  • 32
    • 30144436900 scopus 로고    scopus 로고
    • E. I.du Pont de Nemours & Co. US 2965565, 1958
    • E. I.du Pont de Nemours & Co. US 2965565, 1958.
  • 33
    • 30144432683 scopus 로고    scopus 로고
    • US 2456262, 1948
    • Fields, R. T. US 2456262, 1948.
    • Fields, R.T.1
  • 40
    • 30144435284 scopus 로고    scopus 로고
    • John Wiley & Sons: New York
    • The Static SIMS Library, 1st ed.; John Wiley & Sons: New York, 1996; Vol. 2.
    • (1996) The Static SIMS Library, 1st Ed. , vol.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.