SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 178-179, Issue C, 2010, Pages 347-356

Developments in expert systems for automatic examination of samples by X-ray photoelectron spectroscopy

(1) Castle, J E a

a UNIVERSITY OF SURREY (United Kingdom)

Author keywords

Expert System; Photoelectron spectroscopy; Surface analysis

Indexed keywords

ADHESION SCIENCE; BIO-SYSTEMS; CATALYST SURFACES; CHARACTERISATION; DATA BASE; HIGH RESOLUTION; METALS AND ALLOYS; RULE BASE; SCIENCE AND TECHNOLOGY; SIMPLE RULES; X RAY PHOTOELECTRON SPECTRA; XPS;

ELECTRONS; EXPERT SYSTEMS; METALLURGY; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SPECTRUM ANALYSIS; SURFACE ANALYSIS; SURVEYS; TECHNOLOGY TRANSFER;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77951253814 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2009.07.005 Document Type: Article

Times cited : (6)

References (18)

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- Castle, J.E.¹ Baker, M.A.²

2
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- Castle, J.E.¹

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4
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- Smith, G.C.¹

6
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- Lea A.S., Sisk D.R., Swanson K.R., Haack J.N., Engelhard M.H., Baer D.R., and Castle J.E. Paper presented at AVS 55th International Symposium. Boston (2008)
- (2008) Paper presented at AVS 55th International Symposium
- Lea, A.S.¹ Sisk, D.R.² Swanson, K.R.³ Haack, J.N.⁴ Engelhard, M.H.⁵ Baer, D.R.⁶ Castle, J.E.⁷

7
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- Castle, J.E.¹ Powell, C.J.²

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16
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.