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Volumn 20, Issue 1, 2002, Pages 116-121

Characterization of plasma-enhanced chemical vapor deposition carbon nanotubes by Auger electron spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTALLINE MATERIALS; FIELD EMISSION CATHODES; GROWTH (MATERIALS); PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SUBSTRATES; SURFACE REACTIONS;

EID: 0036118721     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1428281     Document Type: Conference Paper
Times cited : (82)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.