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Journal of Applied Physics

Volumn 107, Issue 2, 2010, Pages

Spectroscopic ellipsometry of wurtzite ZnO and GaN: Examination of a special case

(3) Shokhovets, S a Spiess L a Gobsch, G a

a ILMENAU UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FUNCTIONS; EXCITONIC ABSORPTION; EXPERIMENTAL DATA; FUNDAMENTAL ABSORPTION EDGE; ISOTROPIC MODELS; OPTIC AXIS; ROOM TEMPERATURE; SAMPLE SURFACE; SPECTRAL BEHAVIORS; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; WURTZITES; ZNO;

ABSORPTION; FLUORESCENCE; GALLIUM ALLOYS; GALLIUM NITRIDE; SPECTROSCOPIC ELLIPSOMETRY; ZINC OXIDE; ZINC SULFIDE;

ABSORPTION SPECTROSCOPY;

EID: 75749155089 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3285485 Document Type: Article

Times cited : (25)

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