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Volumn 572, Issue 1, 2004, Pages 93-102

Photoelectron escape from iron oxide

Author keywords

Electron emission; Growth; Iron; Iron oxide; X ray photoelectron spectroscopy

Indexed keywords

CHEMICAL ANALYSIS; ELECTRON EMISSION; METAL FOIL; MONTE CARLO METHODS; OXIDATION; PROBABILITY; SCATTERING; THICKNESS MEASUREMENT;

EID: 7544230829     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.08.032     Document Type: Article
Times cited : (4)

References (50)
  • 1
    • 0006304972 scopus 로고    scopus 로고
    • ASTM Standards E673-95, vol. 3.06, American Society for Testing and Materials, West Conshohocken, PA
    • ASTM Standards E673-95, Annual Book of ASTM Standards, vol. 3.06, American Society for Testing and Materials, West Conshohocken, PA, 1997, p. 907.
    • (1997) Annual Book of ASTM Standards , pp. 907
  • 32
    • 7544240640 scopus 로고    scopus 로고
    • private communication
    • K. Jurek, private communication.
    • Jurek, K.1
  • 47
    • 12844288009 scopus 로고    scopus 로고
    • NIST electron effective-atteauation-length database
    • National Institute of Standards and Technology
    • C.J. Powell, A. Jablonski, NIST Electron Effective-Atteauation-Length Database, Standard Reference Database 82, National Institute of Standards and Technology, 2001.
    • (2001) Standard Reference Database , vol.82
    • Powell, C.J.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.