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Volumn 85, Issue 3, 1997, Pages 257-262
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Escape probability of O 1s photoelectrons leaving copper oxide
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Author keywords
CuO; Depth distribution function; Escape probability of photoelectrons; Mean escape depth; Overlayer method
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Indexed keywords
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EID: 0000820496
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/S0368-2048(97)00070-4 Document Type: Article |
Times cited : (24)
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References (15)
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