Determination of photoelectron attenuation lengths in thin oxide films on iron surfaces using quantitative XPS and elastic recoil detection

Surface and Interface Analysis

Volumn 26, Issue 10, 1998, Pages 758-765

  Roosendaal, S J ^a   Giebels, I A M E ^a   Vredenberg, A M ^a   Habraken, F H P M ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

Elastic recoil detection; Ellipsometry; Iron; Oxidation; Single crystal surfaces; X ray photoelectron spectroscopy

Indexed keywords

ATOMS; ELLIPSOMETRY; IRON; KINETIC ENERGY; OXIDATION; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC RECOIL DETECTION; IRON SURFACES; PHOTOELECTRON ATTENUATION LENGTHS; THIN OXIDE FILMS;

SURFACES;

EID: 0032158456     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199809)26:10<758::aid-sia425>3.0.co;2-b     Document Type: Article

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