Measurements of the escape probability of photoelectrons and the inelastic mean free path in silver sulphide

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 222-227

  Zemek, J ^a   Jiricek, P ^a   Hucek, S ^a   Lesiak, B ^b   Jablonski, A ^b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; FUNCTIONS; PHOTONS; PROBABILITY; SURFACE STRUCTURE;

ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES); EXPONENTIAL FUNCTIONS; GRIES FORMULA; INELASTIC MEAN FREE PATH (IMFP); PHOTOELECTRONS; SILVER SULFIDE;

SILVER COMPOUNDS;

EID: 0034245027     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<222::AID-SIA769>3.0.CO;2-7     Document Type: Article

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