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Volumn 363, Issue 2, 1999, Pages 156-159

Experiments to determine the escape probability of photoelectrons

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000706173     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051163     Document Type: Article
Times cited : (13)

References (22)
  • 5
    • 25144521048 scopus 로고    scopus 로고
    • American Society for Testing and Materials, Philadelphia, 3.06
    • 1995 Annual Book of Standards (American Society for Testing and Materials, Philadelphia, 3.06: 189
    • 1995 Annual Book of Standards , pp. 189


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.