Theoretical analysis of SAW propagation characteristics in (100) oriented AlN/diamond structure

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 57, Issue 1, 2010, Pages 46-51

  Ro, Ruyen ^a   Chiang, Yuan Feng ^b   Sung, Chia Chi ^b   Lee, Ruyue ^a   Wu, Sean ^c  

^a I SHOU UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c TUNG FANG INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AL ELECTRODE; ALN FILMS; COUPLING COEFFICIENT; DUPLEXERS; ELECTRICAL INTERFACE; PROPAGATION CHARACTERISTICS; RF FILTERS; SIMULATION RESULT; THIN METALS;

COPPER; CUTTING; PHASE INTERFACES; PHASE VELOCITY; REFLECTION;

ACOUSTIC SURFACE WAVE DEVICES;

ALUMINUM DERIVATIVE; ALUMINUM NITRIDE; DIAMOND;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; FINITE ELEMENT ANALYSIS; RADIATION SCATTERING;

ALUMINUM COMPOUNDS; COMPUTER SIMULATION; CRYSTALLIZATION; DIAMOND; FINITE ELEMENT ANALYSIS; MODELS, CHEMICAL; SCATTERING, RADIATION;

EID: 73649113822     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2010.1377     Document Type: Conference Paper

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