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Volumn 23, Issue 2-4, 2009, Pages 536-541

Physical properties of transparent conducting indium doped zinc oxide thin films deposited by pulsed DC magnetron sputtering

Author keywords

In doped ZnO (IZO); Pulse DC magnetron sputtering; Raman spectra; Semiconductor; Transparent conducting oxide (TCO)

Indexed keywords

ABSORPTION EDGES; ADDITIONAL MODE; DC MAGNETRON SPUTTERING; DEPOSITION CONDITIONS; DOPED ZINC OXIDE THIN FILMS; DOPED ZNO; EFFECT OF IN; EFFECT OF PULSE; GLASS SUBSTRATES; HIGH MOBILITY; HIGH TRANSMITTANCE; HOST-LATTICE DEFECTS; MICRO-RAMAN; OPTICAL SPECTRA; PHONON MODE; PULSE FREQUENCIES; PULSED DC MAGNETRON SPUTTERING; RAMAN SPECTRA; TRANSPARENT CONDUCTING OXIDE; UV-VISIBLE; ZNO;

EID: 73449117541     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-008-9530-2     Document Type: Article
Times cited : (13)

References (40)
  • 3
    • 0001588720 scopus 로고    scopus 로고
    • 10.1063/1.125854 1:CAS:528:DC%2BD3cXovV2ktA%3D%3D 2000ApPhL.76.661H
    • Y. He J. Kanicki 2000 Appl. Phys. Lett 76 661 10.1063/1.125854 1:CAS:528:DC%2BD3cXovV2ktA%3D%3D 2000ApPhL..76..661H
    • (2000) Appl. Phys. Lett , vol.76 , pp. 661
    • He, Y.1    Kanicki, J.2
  • 4
    • 12744255036 scopus 로고    scopus 로고
    • Power effects in indium-zinc oxide thin films for OLEDs on flexible applications
    • DOI 10.1149/1.1829431
    • J.J. Ho C.Y. Chen 2005 J. Electrochem. Soc 152 G57 10.1149/1.1829431 1:CAS:528:DC%2BD2cXhtFCqsbjK (Pubitemid 40156809)
    • (2005) Journal of the Electrochemical Society , vol.152 , Issue.1
    • Ho, J.-J.1    Chen, C.-Y.2
  • 5
    • 29844453619 scopus 로고    scopus 로고
    • High-performance low-temperature transparent conducting aluminum-doped ZnO thin films and applications
    • DOI 10.1016/j.jcrysgro.2005.10.040, PII S0022024805011620, Proceedings of the International Conference on Materials for Advanced Technologies (ICMAT 2005) Symposium N ZnO and Related Materilas
    • X.T. Hao L.W. Tan K.S. Ong F. Zhu 2006 J. Cryst. Growth 287 44 10.1016/j.jcrysgro.2005.10.040 1:CAS:528:DC%2BD28XhsFOnsA%3D%3D 2006JCrGr.287...44H (Pubitemid 43038824)
    • (2006) Journal of Crystal Growth , vol.287 , Issue.1 , pp. 44-47
    • Hao, X.-T.1    Tan, L.-W.2    Ong, K.-S.3    Zhu, F.4
  • 6
    • 0000917634 scopus 로고    scopus 로고
    • Large and abrupt optical band gap variation in In-doped ZnO
    • DOI 10.1063/1.1342042
    • K.J. Kim Y.R. Park 2001 Appl. Phys. Lett 78 475 10.1063/1.1342042 1:CAS:528:DC%2BD3MXltlSntw%3D%3D 2001ApPhL..78..475K (Pubitemid 33629936)
    • (2001) Applied Physics Letters , vol.78 , Issue.4 , pp. 475-477
    • Kim, K.J.1    Park, Y.R.2
  • 8
    • 33847226669 scopus 로고    scopus 로고
    • 2/Ar gas flow ratio on the electrical and transmittance properties of ZnO:Al films deposited by RF magnetron sputtering
    • DOI 10.1007/s10832-006-7036-3, Special Issue: ICE-2005 International Conference on Electroceramics
    • K. Yim H. Kim C. Lee 2006 J. Electroceram 17 875 10.1007/s10832-006-7036- 3 1:CAS:528:DC%2BD2sXns1amsg%3D%3D (Pubitemid 46307075)
    • (2006) Journal of Electroceramics , vol.17 , Issue.2-4 , pp. 875-877
    • Yim, K.1    Kim, H.2    Lee, C.3
  • 9
    • 0031197973 scopus 로고    scopus 로고
    • 10.1016/S0040-6090(97)00231-9 1:CAS:528:DyaK2sXms1KktLg%3D 1997TSF.306.78O
    • M. Ohyama H. Kozuka T. Yoko 1997 Thin Solid Films 306 1 78 10.1016/S0040-6090(97)00231-9 1:CAS:528:DyaK2sXms1KktLg%3D 1997TSF...306...78O
    • (1997) Thin Solid Films , vol.306 , Issue.1 , pp. 78
    • Ohyama, M.1    Kozuka, H.2    Yoko, T.3
  • 10
    • 17144391382 scopus 로고    scopus 로고
    • Effect of strain gradation on luminescence and electronic properties of pulsed laser deposited zinc oxide thin films
    • DOI 10.1007/s10832-004-5124-9
    • A.C. Rastogi S.B. Desu P. Bhattacharya R.S. Katiyar 2004 J. Electroceram 13 345 10.1007/s10832-004-5124-9 1:CAS:528:DC%2BD2MXhtVChtrw%3D (Pubitemid 40509378)
    • (2004) Journal of Electroceramics , vol.13 , Issue.1-3 , pp. 345-352
    • Rastogi, A.C.1    Desu, S.B.2    Bhattacharya, P.3    Katiyar, R.S.4
  • 12
    • 0033896905 scopus 로고    scopus 로고
    • Magnetron sputtering: A review of recent developments and applications
    • DOI 10.1016/S0042-207X(99)00189-X
    • P.J. Kelly R.D. Arnell 2000 Vacuum 56 159 10.1016/S0042-207X(99)00189-X 1:CAS:528:DC%2BD3cXitVagsbg%3D (Pubitemid 30564470)
    • (2000) Vacuum , vol.56 , Issue.3 , pp. 159-172
    • Kelly, P.J.1    Arnell, R.D.2
  • 17
    • 2142852262 scopus 로고    scopus 로고
    • 10.1116/1.581669 1:CAS:528:DyaK1MXivVShtrg%3D 1999JVST.17.945K
    • P.J. Kelly R.D. Arnell 1999 J. Vac. Sci. Technol. A 17 945 10.1116/1.581669 1:CAS:528:DyaK1MXivVShtrg%3D 1999JVST...17..945K
    • (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 945
    • Kelly, P.J.1    Arnell, R.D.2
  • 19
    • 0342468746 scopus 로고    scopus 로고
    • Time-resolved Langmuir probe measurements at the substrate position in a pulsed mid-frequency DC magnetron plasma
    • DOI 10.1016/S0257-8972(00)00990-7
    • J.W. Bradley H. Baecker P.J. Kelly R.D. Arnell 2001 Surf. Coat. Technol. 135 221 10.1016/S0257-8972(00)00990-7 1:CAS:528:DC%2BD3MXksVSrug%3D%3D (Pubitemid 32093182)
    • (2001) Surface and Coatings Technology , vol.135 , Issue.2-3 , pp. 221-228
    • Bradley, J.W.1    Backer, H.2    Kelly, P.J.3    Arnell, R.D.4
  • 20
    • 0035387764 scopus 로고    scopus 로고
    • Space and time resolved Langmuir probe measurements in a 100 kHz pulsed rectangular magnetron system
    • DOI 10.1016/S0257-8972(01)01084-2, PII S0257897201010842, Proceedings of the 7th International Conference on Plasma Surface Engineering, Garmisch-Partenkirchen, Germany, September 17-21, 2000
    • J.W. Bradley H. Baecker P.J. Kelly R.D. Arnell 2001 Surf. Coat. Technol. 142-144 337 10.1016/S0257-8972(01)01084-2 (Pubitemid 32931733)
    • (2001) Surface and Coatings Technology , vol.142-144 , pp. 337-341
    • Bradley, J.W.1    Backer, H.2    Kelly, P.J.3    Arnell, R.D.4
  • 21
    • 0036576044 scopus 로고    scopus 로고
    • The distribution of ion energies at the substrate in an asymmetric bi-polar pulsed DC magnetron discharge
    • DOI 10.1088/0963-0252/11/2/307, PII S0963025202346759
    • J.W. Bradley H. Baecker Y. Arando-Gonzalvo P.J. Kelly R.D. Arnell 2002 Plasma Sources Sci. Technol 11 165 10.1088/0963-0252/11/2/307 1:CAS:528:DC%2BD38XlsVKhs78%3D 2002PSST...11..165B (Pubitemid 34697197)
    • (2002) Plasma Sources Science and Technology , vol.11 , Issue.2 , pp. 165-174
    • Bradley, J.W.1    Backer, H.2    Aranda-Gonzalvo, Y.3    Kelly, P.J.4    Arnell, R.D.5
  • 22
    • 38949176793 scopus 로고    scopus 로고
    • 10.1016/j.vacuum.2007.10.013
    • C. Guillén J. Herrero 2008 Vacuum 82 668 10.1016/j.vacuum.2007.10. 013
    • (2008) Vacuum , vol.82 , pp. 668
    • Guillén, C.1    Herrero, J.2
  • 23
    • 0037463139 scopus 로고    scopus 로고
    • 10.1016/S0040-6090(02)01332-9 1:CAS:528:DC%2BD3sXitV2itr0%3D 2003TSF.426.111K
    • P.J. Kelly Y. Zhou A. Postill 2003 Thin Solid Films 426 111 10.1016/S0040-6090(02)01332-9 1:CAS:528:DC%2BD3sXitV2itr0%3D 2003TSF...426..111K
    • (2003) Thin Solid Films , vol.426 , pp. 111
    • Kelly, P.J.1    Zhou, Y.2    Postill, A.3
  • 25
    • 84944648082 scopus 로고
    • 10.1107/S0567739476001551 1976AcCrA.32.751S
    • R.D. Shannon 1976 Acta Crystallogr. A 32 751 10.1107/S0567739476001551 1976AcCrA..32..751S
    • (1976) Acta Crystallogr. A , vol.32 , pp. 751
    • Shannon, R.D.1
  • 26
    • 0033889468 scopus 로고    scopus 로고
    • Studying of transparent conductive ZnO:Al thin films by RF reactive magnetron sputtering
    • DOI 10.1016/S0022-0248(99)00779-4
    • J.F. Chang H.L. Wang M.H. Hon 2000 J. Cryst. Growth 211 93 10.1016/S0022-0248(99)00779-4 1:CAS:528:DC%2BD3cXislSjur4%3D 2000JCrGr.211...93C (Pubitemid 30583702)
    • (2000) Journal of Crystal Growth , vol.211 , Issue.1 , pp. 93-97
    • Chang, J.F.1    Wang, H.L.2    Hon, M.H.3
  • 27
    • 79956018368 scopus 로고    scopus 로고
    • Manufacture of specific structure of aluminum-doped zinc oxide films by patterning the substrate surface
    • DOI 10.1063/1.1473683
    • X. Jiang C.L. Jia B. Szyszka 2002 Appl. Phys. Lett 80 3090 10.1063/1.1473683 1:CAS:528:DC%2BD38XjtVOmurs%3D 2002ApPhL..80.3090J (Pubitemid 34562567)
    • (2002) Applied Physics Letters , vol.80 , Issue.17 , pp. 3090
    • Jiang, X.1    Jia, C.L.2    Szyszka, B.3
  • 30
    • 1142292373 scopus 로고    scopus 로고
    • 10.1063/1.1633343 1:CAS:528:DC%2BD2cXmslekuw%3D%3D 2004JAP.95.1246K
    • H.S. Kang J.S. Kang J.W. Kim S.Y. Lee 2004 J. Appl. Phys 95 1246 10.1063/1.1633343 1:CAS:528:DC%2BD2cXmslekuw%3D%3D 2004JAP....95.1246K
    • (2004) J. Appl. Phys , vol.95 , pp. 1246
    • Kang, H.S.1    Kang, J.S.2    Kim, J.W.3    Lee, S.Y.4
  • 31
    • 30344475820 scopus 로고    scopus 로고
    • Dependences of the Al thickness and annealing temperature on the structural, optical and electrical properties in ZnO/Al multilayers
    • DOI 10.1016/j.tsf.2005.10.058, PII S004060900502033X
    • Y.M. Hu C.W. Lin J.C.A. Huang 2006 Thin Solid Films 497 130 10.1016/j.tsf.2005.10.058 1:CAS:528:DC%2BD28XjvVSnuw%3D%3D 2006TSF...497..130H (Pubitemid 43061076)
    • (2006) Thin Solid Films , vol.497 , Issue.1-2 , pp. 130-134
    • Hu, Y.M.1    Lin, C.W.2    Huang, J.C.A.3
  • 34
    • 0004278609 scopus 로고
    • Cambridge University Cambridge
    • R.A. Smith, Semiconductors (Cambridge University, Cambridge, 1968), p. 189
    • (1968) Semiconductors , pp. 189
    • Smith, R.A.1
  • 35
    • 33646202250 scopus 로고
    • 10.1103/PhysRev.93.632 1:CAS:528:DyaG2cXjvVartA%3D%3D 1954PhRv.93.632B
    • E. Burstein 1954 Phys. Rev 93 632 10.1103/PhysRev.93.632 1:CAS:528:DyaG2cXjvVartA%3D%3D 1954PhRv...93..632B
    • (1954) Phys. Rev , vol.93 , pp. 632
    • Burstein, E.1
  • 38
    • 33847710714 scopus 로고    scopus 로고
    • Microstructure, magnetic, and optical properties of sputtered Mn-doped ZnO films with high-temperature ferromagnetism
    • DOI 10.1063/1.2426377
    • W.B. Mi H.L. Bai H. Liu C.Q. Sun 2007 J. Appl. Phys 101 023904 10.1063/1.2426377 2007JAP...101b3904M (Pubitemid 46372808)
    • (2007) Journal of Applied Physics , vol.101 , Issue.2 , pp. 023904
    • Mi, W.B.1    Bai, H.L.2    Liu, H.3    Sun, C.Q.4


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