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Volumn 95, Issue 19, 2009, Pages

Sulfur passivation of InN surface electron accumulation

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM SULFIDE; BANDBENDING; HIGH RESOLUTION; SHEET CHARGE DENSITY; SULFUR PASSIVATION; SURFACE ELECTRON ACCUMULATION; X RAY PHOTOEMISSION SPECTROSCOPY; X-RAY PHOTOEMISSION SPECTRA;

EID: 70449719175     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3263725     Document Type: Article
Times cited : (21)

References (28)
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    • (2003) Surf. Sci. , vol.523 , pp. 231
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  • 9
    • 26744453610 scopus 로고
    • 0163-1829,. 10.1103/PhysRevB.32.6968
    • J. Tersoff, Phys. Rev. B 0163-1829 32, 6968 (1985). 10.1103/PhysRevB.32. 6968
    • (1985) Phys. Rev. B , vol.32 , pp. 6968
    • Tersoff, J.1
  • 20
    • 0000220738 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.373057
    • C. -D. Tsai and C. -T. Lee, J. Appl. Phys. 0021-8979 87, 4230 (2000). 10.1063/1.373057
    • (2000) J. Appl. Phys. , vol.87 , pp. 4230
    • Tsai, C.-D.1    Lee, C.-T.2
  • 22
    • 32644449890 scopus 로고    scopus 로고
    • Inversion and accumulation layers at InN surfaces
    • DOI 10.1016/j.jcrysgro.2005.12.100, PII S0022024805014600
    • T. D. Veal, L. F. J. Piper, W. J. Schaff, and C. F. McConville, J. Cryst. Growth 0022-0248 288, 268 (2006). 10.1016/j.jcrysgro.2005.12.100 (Pubitemid 43243848)
    • (2006) Journal of Crystal Growth , vol.288 , Issue.2 , pp. 268-272
    • Veal, T.D.1    Piper, L.F.J.2    Schaff, W.J.3    McConville, C.F.4
  • 24
    • 0037524206 scopus 로고    scopus 로고
    • On the band gap of indium nitride
    • DOI 10.1002/pssb.200301823
    • B. R. Nag, Phys. Status Solidi B 0370-1972 237, R1 (2003). 10.1002/pssb.200301823 (Pubitemid 36745741)
    • (2003) Physica Status Solidi (B) Basic Research , vol.237 , Issue.2
    • Nag, B.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.