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Volumn 10, Issue 2, 2010, Pages 452-456

Effect of GZO thickness and annealing temperature on the structural, electrical and optical properties of GZO/Ag/GZO sandwich films

(8) Song, Shumei a,b Yang, Tianlin a Xin, Yanqing a Jiang, Lili a Li, Yanhui a Pang, Zhiyong b Lv, Maoshui a Han, Shenghao a,b

a SHANDONG UNIVERSITY (China)

b SHANDONG UNIVERSITY (China)

Author keywords

Annealing; Resistivity; Sandwich film; Transmittance

Indexed keywords

ANNEALING TEMPERATURES; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL PROPERTY; FIGURE OF MERIT; GA-DOPED ZNO; GLASS SUBSTRATES; HEXAGONAL STRUCTURES; IN-VACUUM; ION-BEAM SPUTTERING; POLYCRYSTALLINE; POST ANNEALING; PREFERRED ORIENTATIONS; RESISTIVITY; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; SANDWICH FILM; SANDWICH FILMS; TRANSMITTANCE; X-RAY DIFFRACTION MEASUREMENTS; ZNO;

ANNEALING; DIFFRACTION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; GALLIUM ALLOYS; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SEMICONDUCTING ZINC COMPOUNDS; THERMAL EFFECTS; VACUUM; X RAY DIFFRACTION; ZINC OXIDE;

SILVER;

EID: 70350704819 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2009.07.002 Document Type: Article

Times cited : (34)

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