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Volumn 274, Issue 3-4, 2005, Pages 474-479
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Effects of sputtering power on the properties of ZnO:Ga films deposited by r.f. magnetron-sputtering at low temperature
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Author keywords
A3. Magnetron sputtering; A3. ZnO:Ga films; B2. Electrical and optical properties
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLOGRAPHY;
DEPOSITION;
ELECTRIC CONDUCTIVITY;
ELECTRIC PROPERTIES;
GLASS;
LOW TEMPERATURE EFFECTS;
MAGNETRON SPUTTERING;
MOLECULAR BEAM EPITAXY;
OPTICAL PROPERTIES;
POLYCRYSTALLINE MATERIALS;
RADIATION;
SOL-GELS;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
ANO:GA FILMS;
GLASS SUBSTRATES;
SHEET RESISTANCES;
WURTZITE STRUCTURES;
ZINC OXIDE;
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EID: 12344308342
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.10.037 Document Type: Article |
Times cited : (163)
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References (19)
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