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Volumn 288, Issue 1-2, 1996, Pages 248-253
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Fabrication and characterization of ITO thin films deposited by excimer laser evaporation
a
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Author keywords
Deposition process; Indium oxide; Laser ablation; Tin oxide
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
DIELECTRIC PROPERTIES OF SOLIDS;
ELECTRIC CONDUCTIVITY OF SOLIDS;
FILM GROWTH;
LASER ABLATION;
PULSED LASER APPLICATIONS;
REFRACTIVE INDEX;
SEMICONDUCTING TIN COMPOUNDS;
TRANSPARENCY;
CONDUCTION BANDS;
OPTICAL EFFECTIVE MASS;
PULSED LASER EVAPORATION (PLD);
TIN DOPED INDIUM OXIDES (ITO);
SEMICONDUCTING FILMS;
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EID: 0030288031
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)08824-4 Document Type: Article |
Times cited : (118)
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References (16)
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