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Volumn 288, Issue 1-2, 1996, Pages 248-253

Fabrication and characterization of ITO thin films deposited by excimer laser evaporation

Author keywords

Deposition process; Indium oxide; Laser ablation; Tin oxide

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; FILM GROWTH; LASER ABLATION; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; SEMICONDUCTING TIN COMPOUNDS; TRANSPARENCY;

EID: 0030288031     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08824-4     Document Type: Article
Times cited : (118)

References (16)
  • 9
    • 0029211587 scopus 로고
    • Optoelectronic integrated circuit materials, physics and devices
    • A. Azéma, C. Coutal, J.-C. Roustan, S. Taylor and A. Leycuras, Optoelectronic integrated circuit materials, physics and devices, SPIE Proc., 2397 (1995) 271.
    • (1995) SPIE Proc. , vol.2397 , pp. 271
    • Azéma, A.1    Coutal, C.2    Roustan, J.-C.3    Taylor, S.4    Leycuras, A.5
  • 13
    • 0042825768 scopus 로고
    • Ph.D. Thesis, Nice
    • C. Coutal, Ph.D. Thesis, Nice, 1995.
    • (1995)
    • Coutal, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.