SCOPUS 정보 검색 플랫폼

MRS Bulletin

Volumn 34, Issue 9, 2009, Pages 648-657

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

(4) Bonnell, D A a Kalinin, S V a Kholkin, A L a Gruverman, A a

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; DIGITAL STORAGE; ELECTROMECHANICAL COUPLING; FERROELECTRIC MATERIALS; FERROELECTRICITY; MOLECULAR BIOLOGY; ORGANIC POLYMERS; SCANNING PROBE MICROSCOPY;

ELECTROMECHANICAL BEHAVIOR; ELECTROMECHANICAL COUPLING EFFECTS; FERROELECTRIC DOMAINS; FUNCTIONAL CONTROL; HIGH DENSITY DATA STORAGE; INORGANIC AND ORGANIC MATERIALS; PIEZORESPONSE FORCE MICROSCOPY; STRUCTURAL IMAGING;

NANOTECHNOLOGY;

EID: 70349678646 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs2009.176 Document Type: Article

Times cited : (208)

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