Inelastic electron holography

Ultramicroscopy

Volumn 81, Issue 3-4, 2000, Pages 177-186

  Lichte, Hannes ^a   Freitag, Bert ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; ELECTRON GUNS; FIELD EMISSION MICROSCOPES; HOLOGRAMS; HOLOGRAPHY; IMAGE PROCESSING; LIGHT INTERFERENCE; MATHEMATICAL MODELS; OPTICAL FILTERS; PRISMS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINIUM PLASMONS; BIPRISM INTERFERENCE; COHERENT FIELD EMISSION GUN; IMAGING FILTER; INELASTIC ELECTRON HOLOGRAPHY;

ELECTRON SCATTERING;

ARTICLE; HOLOGRAPHY; IMAGING; RADIATION SCATTERING; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034110033     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00188-6     Document Type: Article

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