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Volumn 109, Issue 2, 2009, Pages 139-146
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The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniques
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Author keywords
Electron holography; Frozen phonon; High resolution TEM; Stobbs factor; Thermal diffuse scattering
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Indexed keywords
ATOMIC PHYSICS;
ATOMS;
DATA RECORDING;
DYNAMICS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON HOLOGRAPHY;
ELECTRON SCATTERING;
ELECTRONS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
HOLOGRAPHIC INTERFEROMETRY;
HOLOGRAPHY;
LASER RECORDING;
MATHEMATICAL MODELS;
MOLECULAR DYNAMICS;
PHONONS;
QUANTUM CHEMISTRY;
SCATTERING;
SEMICONDUCTOR QUANTUM DOTS;
TRANSMISSION ELECTRON MICROSCOPY;
A DENSITIES;
ATOM POSITIONS;
ELECTRON MICROSCOPY.;
FROZEN PHONON;
HIGH-RESOLUTION TEM;
IMAGING CONDITIONS;
IMAGING PROCESSES;
IMAGING SIMULATIONS;
MOLECULAR DYNAMICS SIMULATIONS;
NUMERICAL SIMULATIONS;
PHONON EXCITATIONS;
QUANTITATIVE INTERPRETATIONS;
SCATTERED ELECTRONS;
SCATTERING SIMULATIONS;
STOBBS FACTOR;
THERMAL DIFFUSE SCATTERING;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
ARTICLE;
ATOM;
EXCITATION;
HOLOGRAPHY;
IMAGING SYSTEM;
MOLECULAR DYNAMICS;
SIMULATION;
THERMAL ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
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EID: 57749191727
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2008.08.010 Document Type: Article |
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Times cited : (25)
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References (29)
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