Performance limits of electron holography

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 256-262

  Lichte, Hannes ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Electron holography; Fields in solids; Performance limits

Indexed keywords

OPTICAL RESOLVING POWER; PROBLEM SOLVING; TRANSMISSION ELECTRON MICROSCOPY;

FOURIER SPACE; PERFORMANCE LIMITS; SIGNAL RESOLUTION; WAVE OPTICS;

ELECTRON HOLOGRAPHY;

ARTICLE; HOLOGRAPHY; IMAGE PROCESSING; IMAGING SYSTEM; OPTICAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 38349092033     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.06.006     Document Type: Article

References (23)

1. Hawkes P.W., and Kasper E. Principles of electron optics, Wave Optics vol. 3 (1994), Academic Press, London. 0-12-333354-7
2. Ishizuka K. Acta Crystallogr. A 38 (1982) 773
3. Lehmann M., and Lichte H. Microsc. Microanal. 8 (2002) 447
4. Lichte H. Adv. Opt. Electron Microsc. 12 (1991) 25
5. Van Dyck D., Lichte H., and Spence J.C.H. Ultramicroscopy 81 (2000) 187
6. Rau W.D., Lichte H., Völkl E., and Weierstall U. J. Comp.-Assisted Microsc. 3 (1991) 51
7. A. Rother, Th. Gemming, H. Lichte, Ultramicroscopy, submitted for publication.
8. Lichte H. Ultramicroscopy 38 (1991) 13
9. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., and Urban K. Nature 392 (1998) 768
10. Lenz F., and Voelkl E. Proc. ICEM 12 (1990) 228
11. Harscher A., and Lichte H. Ultramicroscopy 64 (1996) 57
12. Lenz F. Optik 79 (1988) 13
13. Born M., and Wolf E. Principles of Optics. sixth ed (1980), Pergamon Press, Oxford
14. Moellenstedt G., and Dueker H. Z. Physik 145 (1956) 377
15. Lichte H. Ultramicroscopy 64 (1996) 79
16. P. Simon, H. Lichte, P. Formanek, M. Lehmann, R. Huhle, W. Cabrillo-Cabrera, A. Harscher, H. Ehrlich, Electron Holography of Biological Samples, Micron, in press.
17. D. Geiger, H. Lichte, M. Linck, M. Lehmann, Electron Holography with Cs-corrected Transmission Electron Microscope, Microscopy and Microanalysis, in press.
18. Lichte H. Cryst. Res. Technol. 35 (2000) 887
19. Kirkland E.J. Advanced Computing in Electron Microscopy (1998), Plenum Press, New York. 0-306-45936-1
20. Linck M., Lichte H., and Lehmann M. Int. J. Mater. Res. (formerly Z. Metallk.) 97 (2006) 890
21. Lichte H., Formanek P., Lenk A., Linck A., Matzeck Ch., Lehmann M., and Simon P. Annu. Rev. Mater. Res. 37 (2007) 539
22. M. Lehmann, Proceedings of IMC16, vol. 2, Sapporo, Japan, 2006 724.
23. Rother A., Leisegang T., Gemming S., Chaplygin I., Reibold M., Meyer D.C., Paufler P., Lichte H., and Seifert G. Phys. Rev. B 74 (2006) 134116