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Journal of Applied Physics

Volumn 106, Issue 5, 2009, Pages

Study of trap states in polyspirobifluorene based devices: Influence of aging by electrical stress

(2) Renaud, Ćdric a Nguyen, Thien Phap a

a UNIVERSITÉ DE NANTES (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMOPHORES; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; DEGRADATION;

BLUE EMITTING DIODES; COMPLEMENTARY TECHNIQUES; DEGRADATION PROCESS; ELECTRICAL STRESS; GAUSSIAN FUNCTIONS; ORGANIC MATERIALS; POLYSPIROBIFLUORENE; THERMALLY STIMULATED CURRENT;

POLYMERS;

EID: 70349321641 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3195086 Document Type: Article

Times cited : (18)

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