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Volumn 74, Issue 8, 1999, Pages 1144-1146
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Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods
a a b b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
CURRENT VOLTAGE CHARACTERISTICS;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
ELECTRIC ADMITTANCE;
ELECTRON TRAPS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR JUNCTIONS;
INORGANIC SEMICONDUCTORS;
PHENYLENEVINYLENE POLYMER;
SEMICONDUCTING POLYMERS;
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EID: 0033593747
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.123469 Document Type: Article |
Times cited : (44)
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References (13)
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