Aging effects in pentacene thin-film transistors: Analysis of the density of states modification

Applied Physics Letters

Volumn 88, Issue 19, 2006, Pages

  De Angelis, F ^a   Cipolloni, S ^a   Mariucci, L ^a   Fortunato, G ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; AMORPHOUS SILICON; CARRIER CONCENTRATION; DEGRADATION; ELECTRIC PROPERTIES; THERMAL EFFECTS;

AGING EFFECTS; ELECTRICAL CHARACTERISTIC VARIATION; STATES MODIFICATION;

THIN FILM TRANSISTORS;

EID: 33646697722     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2203742     Document Type: Article

References (16)

1. F. De Angelis, S. Cipolloni, L. Mariucci, and G. Fortunato, Appl. Phys. Lett. 86, 203505 (2005).
2. H. Klauk, M. Halik, U. Zschieschang, G. Schimd, W. Radik, and W. Weber, J. Appl. Phys. 92, 5259 (2002).
3. S. Pyo, H. Son, K. Choi, and M. H. Yi, Appl. Phys. Lett. 86, 133508 (2005).
4. Y. Jin, Z. Rang, M. I. Nathan, P. P. Ruden, C. R. Newman, and D. Frisbie, Appl. Phys. Lett. 85, 4406 (2004).
5. A. R. Volkel, R. A. Street, and D. Knipp, Phys. Rev. B 66, 195336 (2002).
6. Y. Suk Yang, S. H. Kim, J. Lee, H. Y. Chu, L. Do, H. Lee, J. Oh, T. Zyung, M. K. Ryu, and M. S. Jang, Appl. Phys. Lett. 80, 1595 (2002).
7. C. R. Kagan, A. Afzali, and T. O. Graham, Appl. Phys. Lett. 86, 193505 (2005).
8. M. Shur and M. Hack, J. Appl. Phys. 55, 3831 (1984).
9. G. Fortunato and P. Migliorato, Appl. Phys. Lett. 49, 1025 (1986).
10. G. Fortunato, D. B. Meakin, P. Migliorato, and P. G. Le Comber, Philos. Mag. B 57, 5 (1988).
11. V. Foglietti, L. Mariucci, and G. Fortunato, J. Appl. Phys. 85, 616 (1999).
12. DESSIS Users Manual Release 6 (ISE Integrated System Engineering, Zurich, Switzerland, 1999); www.ise.ch/products/dessis
13. DESSIS Users Manual Release 6 (ISE Integrated System Engineering, Zurich, Switzerland, 1999); www.ise.ch/products/dessis
14. T. Li, J. W. Balk, P. P. Ruden, I. H. Campbell, and D. L. Smith, J. Appl. Phys. 91, 4312 (2002).
15. Oana D. Jurchescu, J. Baas, and T. T. M. Palstra, Appl. Phys. Lett. 84, 3061 (2004).
16. J. E. Northrup and M. L. Chabinye, Phys. Rev. B 68, 041202 (R) (2003).