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Synthetic Metals

Volumn 122, Issue 1, 2001, Pages 49-52

Aging induced traps in organic semiconductors

(4) Steiger, J a Karg, S a,b Schmechel, R a Von Seggern, H a

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

b IBM RESEARCH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AGING OF MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; LIGHT EMITTING DIODES; THERMAL EFFECTS;

THERMALLY STIMULATED CURRENTS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 0034823532 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/S0379-6779(00)01359-X Document Type: Article

Times cited : (28)

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