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Volumn 90, Issue 8, 2001, Pages 4196-4204

Determination of traps in poly(p-phenylene vinylene) light emitting diodes by charge-based deep level transient spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040333870     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1403669     Document Type: Article
Times cited : (39)

References (39)
  • 37
    • 33744698063 scopus 로고    scopus 로고
    • edited by M. Stavola, Semiconductors and Semimetals Academic, San Diego, CA
    • P. M. Mooney, in Identification of Defects in Semiconductors, edited by M. Stavola, Semiconductors and Semimetals (Academic, San Diego, CA, 1999), p. 93.
    • (1999) Identification of Defects in Semiconductors , pp. 93
    • Mooney, P.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.