Determination of traps in poly(p-phenylene vinylene) light emitting diodes by charge-based deep level transient spectroscopy

Journal of Applied Physics

Volumn 90, Issue 8, 2001, Pages 4196-4204

  Gaudin, Olivier ^a   Jackman, Richard B ^a   Nguyen, Thien Phap ^b   Le Rendu, Philippe ^b  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040333870     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1403669     Document Type: Article

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