Thickness-dependent bending modulus of hexagonal boron nitride nanosheets

Nanotechnology

Volumn 20, Issue 38, 2009, Pages

  Li, Chun ^a   Bando, Yoshio ^a   Zhi, Chunyi ^a   Huang, Yang ^a   Golberg, Dmitri ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BENDING MODULI; CLAMPED PLATES; CONCENTRATED LOAD; HEXAGONAL BORON NITRIDE; LAYER DISTRIBUTIONS; LAYER-BY-LAYERS; METAL FILM; PLATE THEORIES; SHEET THICKNESS; SINGLE-CRYSTALLINE; THINNER SHEETS; THREE-POINT BENDING TEST;

BORON; BORON NITRIDE; ELECTRON BEAMS; NANOSHEETS; NITRIDES; SILICON COMPOUNDS; SINGLE CRYSTALS; STACKING FAULTS;

BENDING TESTS;

BORON NITRIDE NANOTUBE; DIGITOXIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL; ELECTRON BEAM; FILM; PRIORITY JOURNAL; THICKNESS;

EID: 70349107289     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/38/385707     Document Type: Article

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