Study of the bending modulus of individual silicon nitride nanobelts via atomic force microscopy

Applied Physics A: Materials Science and Processing

Volumn 82, Issue 3 SPEC. ISS., 2006, Pages 475-478

  Jing, G Y ^a   Ji, H ^a   Yang, W Y ^a   Xu, J ^a   Yu, D P ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING STRENGTH; DEFECTS; ELASTIC MODULI; IMAGE ANALYSIS; NANOTECHNOLOGY;

BENDING DISPLACEMENT; ELASTIC REGIME; NANOBELTS; STRUCTURAL DEFECTS;

SILICON NITRIDE;

EID: 29044434212     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-005-3335-9     Document Type: Article

References (25)

1. G. Ziegler, J. Heinrich, G. Wötting, J. Mater. Sci. 22, 3041 (1987)
2. D. Muscat, M.D. Pugh, R.A.L. Drew, H. Pick-up, D. Steele, J. Am. Ceram. Soc. 75, 2713 (1992)
3. I.W. Chen, P.F. Becher, M. Mitomo, G. Petzow, T.-S. Yen (Eds.), Silicon Nitride Ceramics - Scientific and Technological Advances (MRS Proceedings, Mater. Res. Soc. 287, Pittsburgh, Pennsylvania 1993)
4. M.J. Hoffmann, G. Petzow (Eds.), Tailoring of Mechanical Properties of Si3N4 Ceramics (NATO ASISeries E, Applied Sciences Vol. 276, Kluwer Academic, Dordrecht 1994)
5. R. Vogelgesang, M. Grimsditch, J.S. Wallace, Appl. Phys. Lett. 76, 982 (2000)
6. M.F. Ashby, D.R.H. Jones, Engineering Materials, Vol. 1 (Pergamon, Oxford 1980);
7. O. Tabata, S. Sugiyama, M. Takigawa, Appl. Phys. Lett. 56, 1314 (1990)
8. P. Hollman, A. Alahelisten, M. Olsson, S. Hogmark, Thin Solid Films 270, 137 (1995)
9. D.R. Lide, CRC Handbook of Chemistry and Physics, 63rd ed. (CRC Press, BocaRaton 1983)
10. B.I. Yakobson, C.J. Brabec, J. Bernholc, Phys. Rev. Lett. 76, 2511 (1996)
11. Z. Xin, Z. Jianjun, O.-Y. Zhong-can, Phys. Rev. B 62, 13692 (2000)
12. E.W. Wong, P.E. Sheehan, C.M. Lieber, Science 277, 1971 (1997)
13. Z.L. Wang, Z.R. Dai, R. Gao, J.L. Gole, J. Electron. Microsc. 51, 79 (2002)
14. M.M.J. Treacy, T.W. Ebbesen, J.M. Gibson, Nature 381, 678 (1996)
15. J. Lu, Phys. Rev. Lett. 79, 1297 (1997)
16. C. Durkan, A. Ilie, M.S.M. Saifullah, M.E. Welland, Appl. Phys. Lett. 80, 4244 (2002)
17. S. Cuenot, S. Demoustier-Champagne, B. Nysten, Phys. Rev. Lett. 85, 1690 (2000)
18. D.A. Walters, L.M. Ericson, M.J. Casavant, J. Liu, D.T. Colbert, K.A. Smith, R.E. Smalley, Appl. Phys. Lett. 74, 3803 (1999)
19. J.-P. Salvetat, G.A.D. Briggs, J.-M. Bonard, R.R. Bacsa, A.J. Kulik, T. Stöckli, N.A. Burnham, L. Forró, Phys. Rev. Lett. 82, 944 (1999)
20. T.W. Tombler, C.W. Zhou, L. Alexseyev, J. Kong, H.J. Dai, L. Lei, C.S. Jayanthi, M.J. Tang, S.Y. Wu, Nature 405, 769 (2000)
21. J. Cao, Q. Wang, H. Dai, Phys. Rev. Lett. 90, 157601 (2003)
22. E.D. Minot, Y. Yaish, V. Sazonova, J.-Y. Park, M. Brink, P.L. McEuen, Phys. Rev. Lett. 90, 156401 (2003)
23. Y.J. Zhang, N.L. Wang, R.R. He, Q. Zhang, J. Zhu, Y.J. Yan, J. Mater. Res. 15 (5), 1048 (2000)
24. W.Y. Yang, H.Z. Miao, Z.P. Xie, L. Zhang, L. An, Chem. Phys. Lett. 383, 441 (2004)
25. F.P. Beer, E.R. Johnston Jr., Mechanics of Materials (McGraw-Hill, New York 1992)