Force-deflection spectroscopy: A new method to determine the young's modulus of nanofilaments

Nano Letters

Volumn 6, Issue 9, 2006, Pages 1904-1909

  Xiong, Qihua ^a,c   Duarte, N ^b   Tadigadapa, S ^b   Eklund, P C ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b The Pennsylvania State University   (United States)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EULER-BERNOULLI EQUATION; FORCE-DEFLECTION SPECTROSCOPY (FDS); PIEZOELECTRIC PROPERTIES;

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; PIEZOELECTRICITY; SEMICONDUCTOR QUANTUM WIRES; SILICON;

NANOTUBES;

NANOMATERIAL; SULFIDE; ZINC DERIVATIVE; ZINC SULFIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; ELASTICITY; EVALUATION; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; MICROMANIPULATION; PARTICLE SIZE; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELASTICITY; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; STRESS, MECHANICAL; SULFIDES; ZINC COMPOUNDS;

EID: 33749672313     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl060978f     Document Type: Article

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