VESPERS: A beamline for combined XRF and XRD measurements

AIP Conference Proceedings

Volumn 879, Issue , 2007, Pages 872-874

  Feng, Renfei ^a   Gerson, Andrea ^b   Ice, Gene ^c   Reininger, Ruben ^d   Yates, Brian ^a   McIntyre, Stewart ^e  

^a CANADIAN LIGHT SOURCE INC   (Canada)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d Scientific Answers and Solutions   (United States)

^e UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Broadband radiation; Laue diffraction; Microscopic strain; Mineral trace analysis; Pink radiation; Synchrotron; X ray absorption spectroscopy; X ray diffraction; X ray fluorescence

Indexed keywords

EID: 33947368147     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436199     Document Type: Conference Paper

References (3)

1. A.A. MacDowell, R. Celestre, C.H. Chang, K. Franck, M.R. Howells, S. Locklin, H.A. Padmore, J.R. Patel, and R. Sandler, SPIE Proceedings, 3152, 1998, pp.126-133.
2. G.E. Ice, J.S. Chung, W. Lowe, E. Williams, and J. Edelman, Rev. Sci. Instrum., 71, 2001-2006 (2000).
3. B.C. Larson, W. Yange, G.E. Ice, J.D. Budai, and J.Z. Tischler, Nature, 415, 887-890 (2002).