Imaging of micro- and nano-structures with hard X-rays

Micro and Nano Letters

Volumn 2, Issue 1, 2007, Pages 1-5

  Rau, C ^a,b,c,d   Crecea, V ^a   Richter, C P ^e   Peterson, K M ^a   Jemian, P R ^a   Neuhausler U ^f   Schneider, G ^g   Yu, X ^a   Braun, P V ^a   Chiang, T C ^a   Robinson, I K ^h  

^a University of Illinois at Urbana Champaign   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c PURDUE UNIVERSITY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e NORTHWESTERN UNIVERSITY   (United States)

^f BIELEFELD UNIVERSITY   (Germany)

^g HAHN MEITNER INSTITUT   (Germany)

^h UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRUCTURE; NANOSTRUCTURES; PHOTONS; X RAY MICROSCOPES; X RAY OPTICS;

IN-LINE PHASE CONTRAST; LENGTH-SCALES; MICROIMAGING; PHOTON SOURCE;

IMAGING SYSTEMS;

NANOMATERIAL;

ARTICLE; DIAGNOSTIC IMAGING; IMAGING AND DISPLAY; MAGNETIC FIELD; MICROSCOPE IMAGE; SYNCHROTRON RADIATION; X RAY; X RAY MICROANALYSIS;

EID: 34249801502     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl:20065060     Document Type: Article

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