The fabrication of carbon nanotube probes utilizing ultra-high vacuum transmission electron microscopy

Nanotechnology

Volumn 20, Issue 28, 2009, Pages

  Chin, Shu Cheng ^a   Chang, Yuan Chih ^a   Chang, Chia Seng ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE PROBES; CONVENTIONAL METHODS; FABRICATION PROCESS; HIGH-RESOLUTION TEM; IN-SITU; MULTI-WALLED CNT; SCANNED IMAGES; SINGLE-WALLED; TEM; TEM SYSTEM; TIP SURFACES;

CARBON NANOTUBES; ELECTRON MICROSCOPES; FABRICATION; PROBES; SCANNING PROBE MICROSCOPY; TRIMMING; ULTRAHIGH VACUUM;

TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBE; MULTI WALLED NANOTUBE;

ARTICLE; ARTIFACT; CHEMICAL MODIFICATION; CONTROLLED STUDY; IMAGE ANALYSIS; IMAGE QUALITY; MOLECULAR PROBE; NANOFABRICATION; OPTICAL RESOLUTION; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; VACUUM; CHEMISTRY; METHODOLOGY; NANOTECHNOLOGY; ULTRASTRUCTURE;

MICROSCOPY, ELECTRON, TRANSMISSION; NANOTECHNOLOGY; NANOTUBES, CARBON;

EID: 67651211352     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/28/285307     Document Type: Article

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