Welding method for fabricating carbon nanotube probe

Journal of Materials Processing Technology

Volumn 190, Issue 1-3, 2007, Pages 397-401

  Xu, Z W ^a   Zhao, Q L ^a   Sun, T ^a   Guo, L Q ^b   Wang, R ^b   Dong, S ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Carbon nanotube; Probe; Resolution; Shorten; Weld

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONS; SILICON; WELDING;

EXTERNAL VOLTAGE; HIGH ASPECT RATIO; SILICON PROBES; WELD STRENGTH;

CARBON NANOTUBES;

EID: 34248154689     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2007.03.107     Document Type: Article

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