Mechanical properties of sharpened carbon nanotube tips

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 4 A, 2005, Pages 1637-1640

  Akita, Seiji ^a   Ohashi, Masakaki ^a   Nakayama, Yoshikazu ^a,b  

^a Osaka Prefecture University   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Bending modulus; Carbon nanotube; Electrical breakdown process; Nano mechanics; Scanning probe microscope tip; Stiffness

Indexed keywords

AMPLITUDE MODULATION; BENDING (DEFORMATION); BOUNDARY CONDITIONS; ELECTRIC BREAKDOWN; ELECTRIC CONTACTS; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; STIFFNESS; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

BENDING MODULUS; ELECTRICAL BREAKDOWN PROCESS; NANO-MECHANICS; SCANNING PROBE MICROSCOPE TIP;

CARBON NANOTUBES;

EID: 21244506225     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.1637     Document Type: Article

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