Toward carbon nanotube-based AFM cantilevers

IEEE Transactions on Nanotechnology

Volumn 6, Issue 5, 2007, Pages 519-523

  Tong, Jianhua ^a,b   Sun, Yu ^a,b  

^a IEEE

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

Atomic force microscopy; Cantilevers; Carbon nanotubes; MEMS NEMS (micro nanoelectromechanical systems)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC RESISTANCE; ELECTRODES; ELECTROPHORESIS; MICROFABRICATION; SILICON; STRAIN CONTROL;

CANTILEVER TIPS; ELECTROMECHANICAL PROPERTIES; STRAIN SENSING;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 34648844151     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2007.901910     Document Type: Article

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