Probing interface roughness by X-ray scattering

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 18-26

  De Boer, Dick K G ^a   Leenaers, Ann J G ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CORRELATION METHODS; ELECTROMAGNETIC WAVE SCATTERING; SURFACE ROUGHNESS; X RAY ANALYSIS;

INTERFACE ROUGHNESS; X RAY SCATTERING;

INTERFACES (MATERIALS);

EID: 0030563050     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00900-0     Document Type: Article

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