SCOPUS 정보 검색 플랫폼

Volumn 100, Issue 15, 2008, Pages

Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

(8) Tonnerre, J M a De Santis, M e Grenier, S a Tolentino, H C N a Langlais, V a,b Bontempi, E c Garcia Fernandez M d Staub, U d

a CNRS (France)

b UNIVERSITAT AUTÒNOMA DE BARCELONA (Spain)

c UNIVERSITY OF BRESCIA (Italy)

d PAUL SCHERRER INSTITUTE (Switzerland)

e VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; MAGNETIZATION; NICKEL COMPOUNDS; X RAYS;

DEPTH MAGNETIZATION PROFILE; EXCHANGE COUPLED SYSTEM; MAGNETIC REFLECTIVITY;

EXCHANGE COUPLING;

EID: 42349111253 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.157202 Document Type: Article

Times cited : (41)

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