Ex situ reflection mode EXAFS at the Ti K-edge of lithium intercalated TiO2 rutile

Surface Science

Volumn 538, Issue 1-2, 2003, Pages 10-22

  Lutzenkirchen Hecht D ^a   Wagemaker, M ^b   Keil, P ^a   Van Well, A A ^b   Frahm, R ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Alkali metals; Titanium oxide; X ray absorption spectroscopy

Indexed keywords

ABSORPTION; DATA REDUCTION; ELECTROCHEMICAL ELECTRODES; LITHIUM; SURFACE STRUCTURE; X RAY SPECTROSCOPY;

ELECTROCHEMICAL PROCESSING;

TITANIUM DIOXIDE;

EID: 0038072772     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00722-2     Document Type: Article

References (46)

1. Blum L., Abruna H.D., White J., Gordon J.G., Borges G.L., Samant M.G., Melroy O.R. J. Chem. Phys. 85:1986;6732.
2. Shi Z., Wu S., Lipkowski J. Electrochim. Acta. 40:1995;9.
3. Davenport A.J., Sansone M., Bardwell J.A., Aldykiewicz A.J. Jr., Taube M., Vitus C.M. J. Electrochem. Soc. 141:1994;L6.
4. Haupt S., Strehblow H.-H. Corros. Sci. 37:1995;43.
5. Landolt D., Mischler S., Vogel A., Mathieu H.J. Corros. Sci. 31:1990;431.
6. Marcus P., Oudar J., Olefjord I. J. Microsc. Spectrosc. Electron. 4:1979;63.
7. Salaita G.N., Lu F., Laguren-Davidson L., Hubbard A.T. J. Electroanal. Chem. 229:1987;1.
8. Baltruschat H., Martinez M., Lewis S.K., Lu F., Song D., Stern D.A., Datta A., Hubbard A.T. J. Electroanal. Chem. 217:1987;111.
9. Kolb D.M. Z. Phys. Chem. NF. 154:1987;179.
10. Wohlmann B., Park Z., Kruft M., Stuhlmann C., Wandelt K. Colloids Surf. A. 134:1998;15.
11. Lützenkirchen-Hecht D., Strehblow H.-H. Electrochim. Acta. 43:1998;2957.
12. Lützenkirchen-Hecht D., Strehblow H.-H. Ber. Bunsen Gesell. Phys. Chem. 102:1998;826.
13. O'Grady W.E., Woo M.Y.C., Hagans P.L., Yeager E. J. Vac. Sci. Technol. 14:1977;365.
14. Felter T.E., Hubbard A.T. J. Electroanal. Chem. 100:1979;473.
15. Neff H., Foditsch W., Kötz R. J. Electron Spectrosc. Relat. Phenom. 33:1984;171.
16. Haupt S., Collisi U., Speckmann H.-D., Strehblow H.-H. J. Electroanal. Chem. 194:1985;179.
17. Richarz F., Wohlmann B., Vogel U., Hoffschulz H., Wandelt K. Surf. Sci. 335:1995;361.
18. Huang S.Y., Kavan L., Exnar I., Grätzel M. J. Electrochem. Soc. 142:1995;L142.
19. Ohzuku T., Kodama T., Hirai T. J. Power Sources. 14:1985;153.
20. Hagfeldt A., Grätzel M. Chem. Rev. 95:1995;49.
21. Cantão M.P., Cisneros J.I., Torresi R.M. Thin Solid Films. 259:1995;70.
22. Stashans A., Lunell S., Bergström R., Hagfeldt A., Lindquist S.E. Phys. Rev. B. 53:1996;159.
23. Ohzuku T., Takehara Z., Yoshizawa S. Electrochim. Acta. 24:1979;219.
24. Zachau-Christiansen B., West K., Jacobsen T., Atlung S. Solid State Ionics. 28-30:1988;1176.
25. Kavan L., Grätzel M., Gilbert S.E., Klemenz C., Scheel H.J. J. Am. Chem. Soc. 118:1996;6716.
26. Maclin W.J., Neat R.J. Solid State Ionics. 53-56:1992;694.
27. Cantão M.P., Cisneros J.I., Torresi R.M. J. Phys. Chem. 98:1994;4865.
28. Frahm R., Weigelt J., Meyer G., Materlik G. Rev. Sci. Instrum. 66:1995;1677.
29. Cava R.J., Murphy D.W., Zahurak S., Santoro A., Roth R.S. J. Solid State Chem. 53:1984;64.
30. Murphy D.W., Greenblatt M., Zahurak S.M., Cava R.J., Waszcak J.V., Hull G.W. Jr., Hutton R.S. Rev. Chim. Miner. 19:1982;441.
31. van de Krol R., Goossens A., Meulenkamp E.A. J. Electrochem. Soc. 146:1999;3150.
32. Luca V., Hanley T.L., Roberts N.K., Howe R.F. Chem. Mater. 11:1999;2089.
33. Wagemaker M., van de Krol R., Kentgens A.P.M., van Well A.A., Mulder F.M. J. Am. Chem. Soc. 123:2001;11454.
34. van de Krol R., Goossens A., Schoonman J. J. Phys. Chem. B. 103:1999;7151.
35. Bard A.J., Faulkner L.R. Electrochemical Methods. 1980;Wiley, New York.
36. Parratt L.G. Phys. Rev. 95:1954;359.
37. Schug C., Lamparter P., Steeb S. Physica B. 248:1998;62.
38. Bevington P.R. Data Reduction and Error Analysis for the Physical Sciences. 1969;McGraw-Hill, New York.
39. Ruiz Lopez M.F., Munoz-Paez A. J. Phys.: Condens. Matter. 3:1991;8981.
40. Heald S.M. Rev. Sci. Instrum. 63:1992;873.
41. Enright B., Fitzmaurice D. J. Phys. Chem. 100:1996;1027.
42. Boschloo G.K., Fitzmaurice D. Proc. Electrochem. Soc. 97-20:1997;84.
43. Kavan L., Grätzel M., Rathousky J., Zukal A. J. Electrochem. Soc. 143:1996;394.
44. van de Krol R., Goossens A., Meulenkamp E.A. J. Appl. Phys. 90:2001;2235.
45. Borthen P., Strehblow H.-H. Physica B. 208-209:1995;421.
46. Koningsberger D.C., Prins R. X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES. 1988;Wiley, New York.