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Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 213-217
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Reflection mode X-ray absorption spectroscopy: New applications in surface science research
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Author keywords
Active dissolution; Atomic short range order; EXAFS; Silver; Solid liquid interfaces
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Indexed keywords
ABSORPTION;
ATOMIC FORCE MICROSCOPY;
DISSOLUTION;
MONOCHROMATORS;
POLYCRYSTALLINE MATERIALS;
SILVER;
SODIUM COMPOUNDS;
X RAY SPECTROSCOPY;
ACTIVE DISSOLUTION;
ATOMIC SHORT-RANGE ORDER;
GRAZING INCIDENCE X-RAY ABSORPTION SPECTROSCOPY (GIXAFS);
SOLID/LIQUID INTERFACES;
NEUTRON REFLECTION;
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EID: 13444291525
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2004.11.060 Document Type: Conference Paper |
Times cited : (8)
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References (24)
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