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Volumn 79, Issue 10, 2008, Pages

A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTRA; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE REFLECTION; ENERGY ABSORPTION; NANOSTRUCTURES; X RAY ABSORPTION;

EID: 55349084751     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2991111     Document Type: Conference Paper
Times cited : (15)

References (41)
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