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Volumn 131, Issue 23, 2009, Pages 8016-8029

Nascent metal atom condensation in self-assembled monolayer matrices: Coverage-driven morphology transitions from buried adlayers to electrically active metal atom nanofilaments to overlayer clusters during aluminum atom deposition on alkanethiolate/gold monolayers

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE METALS; ADLAYER; ADLAYERS; ADSORBATE MOLECULES; ALUMINUM ATOMS; ATOM DEPOSITION; CHEMICAL TRAPPING; CLUSTER NUCLEATION; CONDUCTING FILAMENT; CONDUCTING PROBES; DRIVING FORCES; ELECTRICAL PROPERTY; ESTER GROUPS; IN-SITU; INFRARED REFLECTION SPECTROSCOPY; INORGANIC PRODUCTS; KINETIC PATHWAY; MEMRISTOR; METAL ATOMS; METAL NANOSTRUCTURE; MORPHOLOGY TRANSITIONS; MULTIPLE MODES; NANOFILAMENTS; NON-CONTACT; OHMIC CONDUCTION; ORGANIC DEVICES; ORGANIC MOIETY; RESISTIVE SWITCHING; SAMS;

EID: 67650540784     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja901376w     Document Type: Article
Times cited : (16)

References (81)
  • 3
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  • 55
    • 67650550852 scopus 로고    scopus 로고
    • As the sweeping process proceeds the tip will pick up Al debris and cause the tip radius to increase, thereby lowering the spatial resolution (initial radius curvature < 10 nm). Consequently, the lattice image degradation with coverage could be due in part to a tip effect. This effect was eliminated as a major contribution by observing that the same tip after sweeping was able to detect the (√3 x √3) lattice pattern on a new bare SAM (see Supporting Information)
    • As the sweeping process proceeds the tip will pick up Al debris and cause the tip radius to increase, thereby lowering the spatial resolution (initial radius curvature < 10 nm). Consequently, the lattice image degradation with coverage could be due in part to a tip effect. This effect was eliminated as a major contribution by observing that the same tip after sweeping was able to detect the (√3 x √3) lattice pattern on a new bare SAM (see Supporting Information).
  • 56
    • 67650532214 scopus 로고    scopus 로고
    • Because of the resolution of image (scan area, 1000 x 1000 nm; 256 sampling points per line), the geometry of the cp-AFM tip (radius ∼ 10-30 nm) and the torsional bending of the cantilever with undulation of surface topography, the diameter of current spots taken directly from the image are not accurate. Further, given the tip-surface contact area diameter of up to a few tens of nanometers, the AFM probe is not likely to be able to distinguish single from adjacent, closely spaced multiple filaments
    • Because of the resolution of image (scan area, 1000 x 1000 nm; 256 sampling points per line), the geometry of the cp-AFM tip (radius ∼ 10-30 nm) and the torsional bending of the cantilever with undulation of surface topography, the diameter of current spots taken directly from the image are not accurate. Further, given the tip-surface contact area diameter of up to a few tens of nanometers, the AFM probe is not likely to be able to distinguish single from adjacent, closely spaced multiple filaments.
  • 57
    • 67650562206 scopus 로고    scopus 로고
    • http://webbook.nist.gov/chemistry/.
  • 68
    • 67650556497 scopus 로고
    • Lang, N. D. Phys. Rev. B 1987, 36 (15), 140-143.
    • (1987) Phys. Rev. B , vol.36 , Issue.15 , pp. 140-143
    • Lang, N.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.